ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,523, issued on April 21, was assigned to Synopsys Inc. (Sunnyvale, Calif.). "Application-specific integrated circuit (ASIC) synthesis base... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,524, issued on April 21, was assigned to Synopsys Inc. (Sunnyvale, Calif.). "Logic verification of superconducting electronic circuits, in... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,525, issued on April 21, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.). "Autonomous drive emulation methods and devices"... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,526, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Temperature margin setting method for 3D i... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,527, issued on April 21, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Systems and methods for programming electrical fuse" was invent... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,528, issued on April 21, was assigned to Arm Ltd. (Cambridge, Great Britain). "Systems, devices, and methods for dedicated low temperature... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,529, issued on April 21, was assigned to ASICLAND Co. Ltd. (Suwon-si, South Korea). "System and method for optimizing integrated circuit l... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,530, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Integrated circuit including standard cell... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,531, issued on April 21, was assigned to Cadence Design Systems Inc. (San Jose, Calif.). "System and method for routing in an electronic d... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,532, issued on April 21, was assigned to SILVACO INC. (Santa Clara, Calif.). "Physical verification workflow for semiconductor circuit des... Read More